MetaACE is the first commercial product able to simulate extremely rare synchronizer failure events due to metastability issues. Metastability is an SoC failure mode of critical importance that occurs at the interface between clocked and clockless systems. It is a risk that must be carefully managed as the industry moves to increasingly dense nanoscale designs.
MetaACE is unique in its ability to predict circuit behavior across all variations of process parameters, supply voltages, operating temperatures and the increasingly important effects of circuit aging.
Using MetaACE, the digital system designer is able to identify circuits that may exhibit synchronizer failures and estimate their mean time between failures (MTBF). The analysis of the circuit is done through simulation, allowing the designer to mitigate any problems before fabrication of the integrated circuit, an extremely expensive and time-consuming step.